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Atomic absorption spectrometers
novAA® 800 F
novAA® 800 G
novAA® 800 D
ZEEnit 650 P
ZEEnit 700 P
contrAA® 800 F
contrAA® 800 G
contrAA® 800 D
Optical emission spectrometers
PlasmaQuant® 9100
PlasmaQuant® 9100 Elite
Mass spectrometers
PlasmaQuant MS Elite
PlasmaQuant MS
UF-VIEW-IR spectrometers
SPECORD® 200 PLUS
SPECORD® 210 PLUS
SPECORD® 250 PLUS
SPECORD® 50 PLUS
Optical microscopes Evident (Olympus)
Сonfocal microscopes
Measuring microscopes
Digital cameras
Upright microscopes
Stereo microscopes
Digital microscopes
Inverted microscopes
Polarizing microscopes
Inspection microscopes
Hardness testers EmcoTest
Microhardness testers
Hardness testing machines according to Vickers
Hardness testing machines according to Rockwell
Hardness testing machines according to Brinell
Universal
Portable
Accessories
Materialographic preparation Struers
Cut-off machines
Hot and cold mounting equipment
Grinding and polishing equipment
Electrolytic preparation
Equipment for specimen preparation of microelectronic components
Non-destructive preparation
Equipment for glove boxes
Welding control systems
Accessories
Consumables
Methodological support
Surface physics
Nanohardness testers and scratch testers
Friction gages
Profile meters
Accessories
Contacts
Our Company
Catalogue
Atomic absorption spectrometers
Optical emission spectrometers
Mass spectrometers
UF-VIEW-IR spectrometers
Optical microscopes Evident (Olympus)
Hardness testers EmcoTest
Materialographic preparation Struers
Surface physics
Contacts
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Equipment for specimen preparation of microelectronic components
Equipment for specimen preparation of microelectronic components
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Tripod
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