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Atomic absorption spectrometers
novAA® 800 F
novAA® 800 G
novAA® 800 D
ZEEnit 650 P
ZEEnit 700 P
contrAA® 800 F
contrAA® 800 G
contrAA® 800 D
Optical emission spectrometers
PlasmaQuant® 9100
PlasmaQuant® 9100 Elite
Mass spectrometers
PlasmaQuant MS Elite
PlasmaQuant MS
UF-VIEW-IR spectrometers
SPECORD® 200 PLUS
SPECORD® 210 PLUS
SPECORD® 250 PLUS
SPECORD® 50 PLUS
Optical microscopes Evident (Olympus)
Сonfocal microscopes
Measuring microscopes
Digital cameras
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Hardness testers EmcoTest
Microhardness testers
Hardness testing machines according to Vickers
Hardness testing machines according to Rockwell
Hardness testing machines according to Brinell
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Materialographic preparation Struers
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Equipment for specimen preparation of microelectronic components
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Equipment for glove boxes
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Surface physics
Nanohardness testers and scratch testers
Friction gages
Profile meters
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Our Company
Catalogue
Atomic absorption spectrometers
Optical emission spectrometers
Mass spectrometers
UF-VIEW-IR spectrometers
Optical microscopes Evident (Olympus)
Hardness testers EmcoTest
Materialographic preparation Struers
Surface physics
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