The MX series inspection microscope is designed to examine materials and components used in the microelectronic industry — semiconductors, silicon wafers, crystals, storage devices, LCD displays, MEMS (micro-electro-mechanical-systems), LEDs, etc. The MX series microscopes can be equipped for observation using the following contrast methods: bright field, dark field, polarized light, Nomarski DIC, fluorescence, IR. The controls ergonomics ensures comfort over long working hours.
